Various metrology equipment :
90 products
COMPOSITE SCALE BAR
API has created a new measurement instrument for the machining and metrology industry in the form of a composite scale bar. The composite scale bar has been designed to be deployed for testing and
verification in accordance with ASME B89. This will allow users of Laser Tracking Systems, CMMs, and other measurment devices to verify performance in a lab or shop floor environment.
Lightweight & Portable
Constructed using a lightweight carbon fiber material, the composite scale bar offers both portability and a low coeficient of thermal expansion. It is available in 1 meter, 3 meter, or custom lengths to best fit your application.
What's included?
Composite carbon fibre material resulting in lightweight and rigid construction
NIST Traceable Certificate of Length
Various mounting methods to Assist in Measurement
Accessories to allow testing in compliance with the new B89 Standard
Portable Carrying Case Measurement
Two precision mounted magnetic nets for SMRs or reference spheres
As carbon fibre composites continue to become more prevalent in manufacturing, having a tracable reference of like material is essential. Not only does the API composite scale bar offer unmatched portability and quality, but it also makes it simple to verify your job without considering thermal effects on multiple materials.
Verify system performance
The precision carriage holds two targets at the same time; so the 3D coordinates of the objects to be measured can be checked parallel to the measured value of the laser interferometer. The carriage holds a retro-reflector (for the Laser Tracker) as well as a steel ball (for CMM with tracer).
Before, After, and During a Job
At the shop floor level
In a laboratory environment
In accordance with B89
>>>
View the product on apisensor.com
API - Automated Precision
METROLOGY TOOL - IMS WF, SC ULTRA
The CAMECA IMS Wf and SC Ultra are designed to meet the increasing needs for dynamic SIMS measurements in advanced semiconductors.
A first requisite is the optimization of SIMS analytical conditions
for ultra-shallow depth profiling. This requires sputtering at Ultra-Low Energy with well-controlled conditions (species, angle, gas flooding).
As SIMS technique matures, users want to reduce the expertise required to achieve high reproducibility and high precision measurements. The trend is clearly toward unattended, automated analysis.
The capability of full wafer analysis and mapping is a growing demand due in part to the increased cost of the 200mm or 300mm wafers. In addition, due to the increasing complexity of manufacturing processes, measurements from small test areas of patterned wafers are now prefered to blank wafer analysis, in order to be really representative of the product. This increases the need for high transmission instruments (magnetic sector SIMS capable of high sensitivity from small sputtered craters).
Finally, a ULE-SIMS should also be capable of high sample throughput and fast deep depth profiling.
Common main features:
Two ion columns in order to sputter down to 250 eV impact energy (for O2+ and Cs+ ): one floating primary column at 58° with Cs and/or duoplasmatron; a second column at 36° with duoplasmatron and accel-decel.
New Shielded Multi-mode Immersion Lens (SMIL) allowing the simultaneous combination of high analyzer transmission (high extraction field) and Ultra Low impact Energy capabilities at optimum sputter angles.
Factory aligned primary ion column without any moveable aperture.
Analyzer fully computer-controlled with motorized apertures.
Automated, unattended sequential analysis. Full remote control with simple interface.
3 axis X-Y-Z horizontal stage with automated sample height correction using a Z-autofocus for best reproducibility.
Two sample-parking positions in the load-lock.
Eucentric rotating stage option, compatible with full wafer analysis, for improvement of depth resolution through the reduction of sample roughening e.g. in metallic layers.
Different versions:
SC Ultra:
- 75 mm x 75 mm maximum sample size. Loading of up to 25 samples (8x8mm) in one batch.
- Manual 75 mm load-lock & sample transfer.
IMS Wf:
- 300 mm x 300 mm maximum sample size: accepts 300 mm or 200 mm wafer, five 100 mm wafers, seventeen 50mm wafers or shuttle loaded with small pieces.
- Sample loading and exchange automated using commercial 300 mm robotics
- Optional cassette to cassette loader (FOUP & SMIF).
>>>
View the product on cameca.fr
Cameca
METROLOGY SOFTWARE PARAGON
The Paragon test and measurement program is part of the Paragon test and measurement system developed by Turbine Metrology LLC. Its purpose is to acquire external roundness and flatness data from a
test fixture consisting of rotating test table, and one or more highly sensitive positional indicators ("gauge head").
The part to be measured is centred on the table and rotated to a pre-defined reference point. The gauge head(s) are then adjusted to value previously calibrated as a zero reference points. While the part is under test and the table is rotating, the gauge heads track the small variance in the part being tested and return values to the data acquisition system corresponding to these changes.
When the test is completed, the data is used to calculate the results of the test based upon the pre-defined tolerances of the part being tested. The data can be plotted and the results can be displayed. When the test is complete, the data can be saved for future examination, for a permanent record of the test for a particular part.
The system makes all standard calculations to provide Roundness, Concentricity, Run-out, Flatness, and Parallelism results.
Mathematical algorithms correct data for part off-centeredness on the inspection table.
The system is available either in a stand-alone version with an internal database or with a network capability for larger shops.
PARAGON runs on an industrial PC base under a Windows NT operating system. Any operator familiar with Windows-driven applications can learn the system in a very short period of time.
True 16 bit analog-to-digital conversion yields resolution to .125 microns (.000005 inches) on the shop floor.
Uses standard Brown and Sharpe bi-directional gauge heads; other types of gauge heads and transducers easily accommodated.
Four channels standard, expandable to twelve channels.
User and Administrator access levels.
PARAGON is built from the most advanced data acquisition hardware available and features true 16-bit analog-to-digital conversion capable of sampling 8 channels of data simultaneously at a rate of 124,000 readings per channel per second. This rate is hundreds of times faster than other systems and allows the use of sophisticated anti-aliasing filters.
PARAGON is the only system designed from the ground up to be utilized in a shop floor environment; sampling techniques and digital signal processing allow accurate, meaningful data to be obtained in high ambient noise, high vibration areas and in close proximity to machining centres.
>>>
View the product on eimeldingen.com
EIMELDINGEN
